Novel Bonding technologies for wafer-level transparent packaging of MOEMS

نویسندگان

  • Herwig Kirchberger
  • Paul Lindner
  • Markus Wimplinger
چکیده

Packaging costs of Micro-Electro-Mechanical System (MEMS) are still contributing with >50% to the total costs of most devices. Aligned wafer bonding techniques for Wafer-level packaging (WLP) demonstrates a huge potential to reduce these costs due to a smaller size of the total package, improved performance and shorter time to market. A special group of MEMS devices, Micro-OptoElectro-Mechanical Systems (MOEMS), enjoys the potential to account for almost one third of the total MEMS sales by 2010, mainly driven by Digital Mirror Devices (DMD). MOEMS packages do require optical transparency at the operating wavelength of the individual sensors and actuators in addition to the conventional MEMS packaging requirements. This paper presents well understood wafer bonding and bond alignment technologies as well as high-volume proven equipment solutions for next generation transparent WLP of MOEMS.

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

Via-First Inter-Wafer Vertical Interconnects utilizing Wafer-Bonding of Damascene-Patterned Metal/Adhesive Redistribution Layers

Three-dimensional (3D) integration with through-die vias offer improved electrical performance compared to edgeconnected wire bonds in stacked-die assemblies. Monolithic wafer-level 3D integration offers the potential for a high density of micron-sized through-die vias necessary for highest performance of integrated systems. In addition, such wafer-level technologies offer the potential of lowe...

متن کامل

Wafer Level Cameras – Novel Fabrication and Packaging Technologies

The increasing demand for more functions and features coming along with cost reduction plays a significant role in today’s product design and manufacturing technologies of mobile devices such as PDAs, laptop computer and mobile phones. Besides the main function of the device, imaging is considered as core feature by the user and major mobile phone manufacturers. Therefore the industry puts a lo...

متن کامل

TSV MEOL (Mid-End-Of-Line) and its Assembly/Packaging Technology for 3D/2.5D Solutions

Increasing demand for new and more advanced electronic products with a smaller form factor, superior functionality and performance with a lower overall cost has driven semiconductor industry to develop more innovative and emerging advanced packaging technologies. One of the hottest topics in the semiconductor industry today is a 3D packaging using Through Silicon Via (TSV) technology. Driven by...

متن کامل

A technique to design complex 3D lab on chip involving multilayered fluidics, embedded thick electrodes, and hard packaging - Application to dielectrophoresis and electroporation of cells

multilayered fluidics, embedded thick electrodes, and hard packaging Application to dielectrophoresis and electroporation of cells G Mottet, J Villemejane, L M Mir and B Le Pioufle 1 SATIE, ENS Cachan, 61av Président Wilson, 94235 Cachan cedex France 2 CNRS, UMR 8121, Institute Gustave-Roussy, 39 rue Camille Desmoulins, 94805 Villejuif cedex France 3 Université Paris Sud, UMR 8121 guillaume.mot...

متن کامل

Towards micro-assembly of hybrid MOEMS components on reconfigurable silicon free-space micro-optical bench

The 3D integration of hybrid chips is a viable approach for the micro-optical technologies to reduce the costs of assembly and packaging. In this paper a technology platform for the hybrid integration of MOEMS components on a reconfigurable free-space silicon micro-optical bench is presented. In this approach a desired optical component (e.g. micromirror, microlens) is integrated with removable...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

عنوان ژورنال:
  • CoRR

دوره abs/0802.3103  شماره 

صفحات  -

تاریخ انتشار 2007